NDT.net - December 2002, Vol. 7 No.12

A NEW COMPUTER BASED CONCEPT FOR DIGITAL RADIOGRAPHIC REFERENCE IMAGES

Uwe Ewert, Uwe Zscherpel
(BAM-Berlin, Germany, uwe.ewert@bam.de, uwe.zscherpel@bam.de),
Mike Horky, Jim Kennedy, Mike Hutchinson
(Boeing, USA, michael.d.horky@PSS.Boeing.com,
james.c.kennedy@PSS.Boeing.com, michael.c.hutchinson@PSS.Boeing.com)
Paper presented at the 8th ECNDT, Barcelona, June 2002

Abstract

Introduction

Basic Concept

Generation of digital master copies

Measurement of detector properties

Point spread function (PSF)

Transformation of master data to reference images

Application to film digitisation

Application to computed radiography

Flat panel detectors

Conclusion

References:

  1. Image Sciences principles, analysis and evaluation of photographic type imaging processes, J. C. Dainty, R. Shaw, Academic press, London, New York, San Francisco, 1974, Chapter 7.
  2. Zscherpel, U.: "Film digitization systems for DIR: Standards, Requirements, Archiving and Printing", NDT.net, May 2000, Vol. 5 No. 05, http://www.ndt.net/article/v05n05/zscherp/zscherp.htm
  3. Ewert, U. , Stade, J., Zscherpel, U., Kaling, M., Materialprüfung, 37, 1995, pp. 474-478.
  4. Soltani, P.K., Wysnewski, D., Swartz, K., "Amorphous Selenium Direct Radiography for Industrial Imaging", DGZfP-Symposium, Berlin, 1999, Proceedings on CD, see : http://ndt.agfa.com/bu/ndt/index.nsf/EN/techinfolibrary.htm
  5. Casagrande, J.M., Koch, A., Munier, B., P.de Groot, "High Resolution Digital Flat-Panel X- Ray Detector – Performance and NDT Application", 15 th WCNDT, Rome, 2000, see http://www.ndt.net/article/wcndt00/papers/idn615/idn615.htm.

6. Acknowledgement

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