NDT.net - December 2002, Vol. 7 No.12

Automatic selection of seeds using pattern recognition techniques in high resolution x-ray images

Jean-Michel Lיtang, Gilles Peix and Laurent Droulez
(CNDRI / INSA-Lyon, 69621 Villeurbanne cedex, France) (jean-michel.letang@insa-lyon.fr)
Paper presented at the 8th ECNDT, Barcelona, June 2002



Application context

Design of the experimental set-up

Pattern recognition measures for automatic selection

Image preprocessing

Shape discrimination: biseed vs. monoseed

Monoseed specific testing




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