NDT.net - December 2002, Vol. 7 No.12

UPHEAVAL IN INDUSTRIAL RADIOLOGY

Uwe Ewert
(BAM Berlin, Germany, uwe.ewert@bam.de)
Paper presented at the 8th ECNDT, Barcelona, June 2002

0. Abstract

1. Introduction:

2. Overview about the development of the last years

3. Filmless Radiography

4. Intelligent Methods as Result of New Detector Technology

5. References:

  1. Zscherpel, U.: "Film digitization systems for DIR: Standards, Requirements, Archiving and Printing", NDT.net, May 2000, Vol. 5 No. 05, http://www.ndt.net/article/v05n05/zscherp/zscherp.htm
  2. ASTM E2007-00: Standard guide for computed radiology (Photostimulable Luminescence (PSL) Method). ASTM E2033-99: Standard practice for computed radiology ASTM E20xx-xx: Qualification for computed radiology, under development
  3. CEN drafts on Computed Radiography, see http://trappist.kb.bamde/UA-CR/
  4. Ewert, U. , Stade, J., Zscherpel, U., Kaling, M., Materialprüfung, 37, 1995, pp. 474-478.
  5. Redmer, B. Ewert, U.,Onel, Y., Baranov, V.: "Untersuchungen zur Optimierung der Aufnahmeanordnung für die Tomosynthese und strukturabhängige Vorfilterung", Jahreskonferenz der DGZfP, Lindau, 13.-15. Mai 1996, Berichtsband, S.637-647
  6. Redmer, B. Ewert, U. et al. "Sensitive Detection of planar Defects by a Mechanised Radiometric Weld Inspection System" 15th WCNDT, Rome, 2000, see http://www.ndt.net/article/wcndt00/papers/idn370/idn370.htm
  7. Ewert, U., Robbel, J., Bellon, C., Schumm, A., Nockemann, C.: ‘Digital Laminography", Materialforschung, 37 (1995), H.6, S.218-222.
  8. OIS Engineering Ltd.: "Ffreshex: A combined System for Ultrasonic and X-Ray Inspection of welds", 15th WCNDT, Rome, 2000, see http://www.ndt.net/article/wcndt00/papers/idn286/286.htm
  9. Hentschel, M.P., Müller, B.R. et al.: "New development in X-Ray Topography of advanced non-metallic materials", 15th WCNDT, Rome, 2000, see http://www.ndt.net/article/wcndt00/papers/idn258/idn258.htm
  10. Casagrande, J.M., Koch, A., Munier, B., P.de Groot, "High Resolution Digital Flat-Panel X-Ray Detector – Performance and NDT Application", 15th WCNDT, Rome, 2000, see http://www.ndt.net/article/wcndt00/papers/idn615/idn615.htm
  11. Soltani, P.K., Wysnewski, D., Swartz, K., "Amorphous Selenium Direct Radiography for Industrial Imaging", DGZfP-Symposium, Berlin, 1999, Proceedings on CD, see : http://ndt.agfa.com/bu/ndt/index.nsf/EN/techinfolibrary.htm.
  12. Goebbels, J., Weidemann, G., Dittrich, R., Mangler, M., Tomandl, G., "Functionally Graded Porosity in Ceramics - Analysis with High Resolution Computed Tomography", Proceedings of 103rd Annual Meeting of the American Ceramic Society, April 22-25,2001, Indianapolis, Indiana, USA, Ceramic Transactions, 129 (2002), 103-124.
  13. Harbich K.-W., Hentschel, M.P., Schors, J., "X-ray refraction characterisation of non-metallic materials", NDT&E International, 34 (2001) 297-302.
  14. Ewert, U., Zscherpel, U., Proceedings of the NAARRI International Conference on Applications of Radioisotopes and Radiation Technology in the 21st Century, pp. 1-17, Bombay, India, 12.- 14.12.2001.

6. Acknowledgement

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