NDT.net - December 2002, Vol. 7 No.12

GE a-Si FLAT PANEL DETECTOR PERFORMANCE IN INDUSTRIAL DIGITAL RADIOGRAPHY

Dr. Gregory A. Mohr
(GE Inspection Technologies, Cincinnati, OH 45215 USA)
(Gregory.Mohr@crd.ge.com)
Dr. Clifford Bueno
(GE Global Research, Niskayuna, NY 12309 USA)
(Clifford.Bueno@crd.ge.com)
Paper presented at the 8th ECNDT, Barcelona, June 2002

Abstract

Introduction

Performance Measurements

Imaging Performance

Applications

Conclusion

References

  1. C. Bueno, A. D. Matula, "Digital Radiography for Gas Turbine Components", Proceedings from ASM Gas Turbine Materials Conference, 12-15 October 1998, Rosemont, IL. P. J. Maziasz; I. G. Wright; W. J. Brindley; J. Stringer; C. O’Brien, editors. ASM International, Materials Park, OH, pp. 119-122.
  2. C. Bueno, M. D. Barker, P. E. Condon and R. A. Betz, "Solid State X-ray Imaging Methodology", Final Report, Contract No. F33615-89-C-5617, WL-TR-92-4003, March, 1992.
  3. G. A. Mohr, W. T. Tucker, M. K. Cueman, “Performance Modeling of Scintillator- based X-ray Imaging Systems”, Review of Progress in Quantitative Nondestructive Evaluation, vol. 11, pp 355-62, 1992.

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