NDT.net - December 2002, Vol. 7 No.12

NEW NEEDLE-CRYSTALLINE DETECTOR FOR X-RAY COMPUTER RADIOGRAPHY (CR)

Paul, J.R. Leblans
leblans@twi.agfa.be; phone 03-444-2880; fax 03-444-7655;
Agfa-Gevaert N.V., RDM-TI, Septestraat 27,
B-2640 Mortsel, Belgiכ
Peter Willems, Leo B. Alaerts
Agfa-Gevaert N.V., Research & Development of Materials, Technical Imaging
Paper presented at the 8th ECNDT, Barcelona, June 2002

Abstract

1. Introduction

2. Storage phosphor image plates

3. Experimental

4. Results

5. SNR comparison with Film and with an a-Se flat-panel system

6. Conclusions

Acknowledgements

References

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  2. W. Hillen, W. Eckenbach, P. Quadflieg, T. Zaengel, "Signal-to-noise performance in Cesium Iodide X-ray fluorescent screens", Proc. of SPIE Vol. 1443, Medical Imaging V: Image Physics, ed. R.H. Schneider, pp. 120-131, 1991
  3. M. Thoms, "Photostimulated luminescence: a tool for the determination of optical properties of defect centers", Journal of Luminescence, 60-61, pp. 585-587, 1994
  4. J.H. Siewerdsen, "Signal, noise, and detective quantum efficiency of a-Si:H flat-panel imagers", Dissertation submitted in partial fulfillment of the requirements for the degree of Doctor of Philosophy (Physics) in the University of Michigan, 1998
  5. B. Rodricks, P. Soltani, B. Vaessen, P. Willems, "Optimization of a Se+TFT-based digital imaging system for wide-dynamic range NDT applications", to be published

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