NDT.net - March 1999, Vol.4 No.3
PACNDT '98 Table of Contents

Microwave Ondestructive Testing of Thin Multilayers Conductive Structures

Valeri V. Gavriline, Dr. Eng., CashCode
Corresponding Author Contact:
Email: valeri@cashcode.com

TABLE OF CONTENTS


Introduction

Surface Impedance of Thin Conducting Film, Boundary Conditions

Impedance Technique and Relationships for Multi Layer Structures with Thin Conducting Films

Remote inspection of parameters for Large-Area Conducting Structures in transmitted Microwave Signal

Control of Ultra-Thin Films by an Open Resonator-type Microwave Transducer.

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