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A novel Surface Eddy Current probe with Phase Information on Surface Flaw Depth

H. HOSHIKAWA, K. KOYAMA, and H. KARASAWA
Nihon University
Izumicho Narashino Chiba 275-8575, Japan
Tel: +81-47-474-2396, Fax: +81-47-474-2399
Email : hhoshi@hos.ee.cit.nihon-u.ac.jp
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Abstract

INTRODUCTION

CONVENTIONAL PANCAKE COIL PROBE

A NEW EDDY CURRENT PROBE

EXPERIMENTAL SETUP

EXPERIMENTAL RESULTS

CONCLUSION

REFERENCES

  1. C. V. Dodd, W. E. Deed, "Analytical Solution to Eddy Current Probe-Coil Problems,"
    Journal of Applied Physics, Vol.39, No.6, pp2829-2838 (1968)
  2. M. Onoe, "An Analysis of a Finite Solenoid Coil Near a Conductor," (in Japanese)
    Journal of IEE of Japan, Vol.88-10, No.961, pp1894-1902 (1968)
  3. H. Hoshikawa, K. Koyama, "A New Eddy Current Probe Using Uniform Rotating Eddy
    Current," Materials Evaluation, Vol.56, No.1, pp85-89 (1998)

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