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New development in X-Ray Topography of advanced non-metallic materials

M. P. Hentschel, B. R. Müller, A. Lange, K.-W. Harbich, J. Schors, O. Wald
Federal Institute for Materials Research and Testing, BAM-VIII.32, D-12200 Berlin Tel.: +49 03 8104 1832,
E-mail: Manfred.Hentschel@bam.de

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Topography for Non-destructive Characterisation of Materials

Principles of X-ray Topography

X-Ray Topography by wide angle scattering

X-Ray Topography by Small Angle Scattering

Further potential

Literature

  1. Lang, A. R.: Topography, X-ray diffraction, in: G.L.Clark (Ed): The Encyclopedia of X-rays and Gamma Rays, Reinhold Publishing Corporation, New York 1963, pp1053
  2. v. Laue, M.: Röntgenstrahlinterferenzen, Akademische Verlagsgesellschaft Frankfurt/M. 1960
  3. 3 Porod, G.: Die Röntgenkleinwinkelstreuung von dichtgepackten kolloidalen Systemen, I.Teil, Kolloid.-Z. 124, (1951) pp 83-114
  4. Hentschel, M.P.; Hosemann, R.; Lange, A.; Uther, B.; Brückner, R.: Röntgenkleinwinkelbrechung an Metalldrähten, Glasfäden und hartelastischem Polypropylen. Acta Cryst. A 43 (1987) pp. 506-513
  5. Hentschel, M.P.; Harbich, K.-W.; Lange, A.: Non-destructive evaluation of single fiber debonding by X-ray refraction. NDT & E international 27 (1994) pp. 275-280
  6. Hentschel, M.P.; Kempf, G.; Lange, A.: Röntgen-Rückstreu-Topometrie. Materialprüfung 32 (1990) pp. 267-269
  7. Hentschel, M.P.; Lange, A.; Harbich, K.-W.; Ekenhorst, D.; Schors, J.: Röntgentopographie der Faser- und Polymerorientierung. Materialprüfung 39 (1997) pp. 121-123
  8. Stephenson, J.D.; Hentschel, M.P.; Lange, A.: Synchrotron radiation (hard) X-ray diffraction microscopy of carbon fiber reinforced plastic (CFRP). Nuclear Instruments and Methods in Physics Research B 88 (1994) pp. 287-292
  9. Mücke, U., Harbich, K.-W., and Rabe, T.: Determination of pore sizes on sintered ceramic materials using image analysis and X-ray refraction. Ceramic forum international / Ber. d. DKG, 74 (1997) pp. 95-98
  10. Hentschel, M.P.; Lange, A.; Müller, R.B.; Schors, J.; Harbich, K.-W.; Röntgenrefraktions-Computertomographie. Materialprüfung 42 (2000) pp. 217-221

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