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Quantitative Guided Wave NDE

J. L. Rose, S. P. Pelts, Jian Li
Department of Engineering Science and Mechanics
The Pennsylvania State University
212 Earth & Engineering Science Building
University Park, PA 16802
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ABSTRACT

INTRODUCTION

MODELING ANALYSIS AND SAMPLE RESULTS

CONCLUDING REMARKS

ACNOWLEDGEMENTS

REFERENCES:

  1. Rose J. L. Ultrasonic waves in solid media, Cambridge University Press, 1999
  2. Cho Y., Rose J. L. A boundary element solution for a mode conversion study on the edge reflection, JASA, vol. 99, no. 4, pt. 1, pp. 2097-2109
  3. Rose J. L., Pelts S. P., and Cho Y. Modeling for flaw sizing potential with guided waves, Journal of Nondestructive Evaluation (to be published).
  4. Pelts S. P., Cysyk J. P., Rose J. L., The boundary element method for Flaw Classification in Wave Guides, Review of Progress in Quantitative Nondestructive Evaluation, vol. 16, Plenum Press, New York, pp. 137-143, 1996.
  5. Cho Y., Hongerholt D. D., and Rose J.L. Lamb wave scattering analysis for reflector characterization, IEEE Trans. Ultrason. Ferroelec. Freq. Contr., vol. 44, no. 1, pp. 44-52, 1997.
  6. Abduljabbar A., Datta S. K. Diffraction of horizontally polarized shear waves by normal edge cracks in a plate, J. Appl. Phys., vol. 54, no.2, pp. 461-472, 1983.
  7. Datta S. K., Al-Nassar Y., and Shah A. H., Lamb wave scattering by a surface breaking crack in a plate, Review of Progress in Quantitative Nondestructive Evaluation, vol. 10, Plenum Press, New York, pp. 97-104, 1991.
  8. Koshiba M., Karakida S., and Suzuki M. Finite element analysis of Lamb wave scattering in an elastic plate waveguide, IEEE Trans. Sonics Ultrason., vol. SU-31, pp.18-25, 1984.
  9. Koshiba M., Hasegawa K., and and Suzuki M. Finite-element solution of horizontally polarized shear wave scattering in an elastic plate, IEEE Trans. Ultrason. Ferroelec. Freq. Contr., vol. 34, no. 4, pp. 461-466, 1987.
  10. Fortunko C. M., King R. B., and Tan M. Nondestructive evaluation of planar defects in plates using low-frequency shear horizontal waves, J. Appl. Phys.., vol. 53, pp.3450-3458, 1982.

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