·Table of Contents
·Materials Characterization and testing

A Methodological Approach to Fault Location of IC Modules

Qian Zhihong, Ma Yukuan, Gao Minghui, Dai Yisong
Department of Electronics Engineering, Jilin University of Technology, Changchun, Jilin 130025, P.R.China
Zhao Xiaoming
The Second Aeronautical College of the Air force, Changchun, Jilin 130025, P.R.China







  1. I. Koren and C. Stapper, "Yield Models for defect-tolerant VLSI circuits: A review," Defect and Fault-Tolerance in VLSI Systems. New York: Plenum Press, 1989, pp.1-21.
  2. C. Stapper, F.Armstrong, and K.Saji, "Integrated circuits yield statistics, " Proc. IEEE, vol.71, pp.453-470, Apr. 1983.
  3. I. Koren and D. Pradhan, "Modeling the effect of redundancy on yield and performance of VLSI systems," IEEE Trans. Computers, vol. 37, no. 3, pp.344-355, Mar 1987.
  4. C. Thibeault, Y.Savaria, and J.L.Houle, "Equivalence proofs of some yield modeling methods for defect-tolerant integrated circuits," IEEE Trans. Computers, vol. 44, no. 5, pp.724-728, May 1995.
  5. S.J. Sangwine, "Diagnosis of multiple faults in combinational digital circuits by modeling of transition propagation along critical paths," IEE Proc.-G, Vol. 139, No. 5, Oct. 1992.
  6. Y.S. Dai, "Design of low-noise test instruments," Chinese Journal of Scientific Instrument, vol.1, no.1, 1980, pp.123-133.
  7. Y.S. Dai, Noise in Electronic Systems and Design of low-noise Systems (in Chinese). Changchun, China: Jilin People's Publising House, 1984.
  8. T. Luo, Y.S. Dai, "Noise circuit theory and noise calculation of integrated circuits," Acta Electronica Sinica (in Chinese), vol.18, no.6, 1990, pp.79-83.
  9. A.V.D.Ziel, Noise: Sources, Characterization, and Measurements. Prentice Hall, Englewood Cliffs, N.J., 1970.
  10. R.A. Horn and C.R. Johnson, Matrix Analysis, Cambridge: Cambridge University Press, 1990.
  11. Qian Zhihong, Zhao Xiaoming and Dai Yisong. "En-In models study of automotive IC modules." Proc. IEEE IVEC'99, Changchun, China, Sept. 1999, pp.188-192
  12. P. Bowron and K.A. Mezher, 'Noise and sensitivity optimisation in the design of second-order single-amplifier filters," Int. J. Circuit Theory Appl., vol. 19, 1991, pp.389-402.
  13. D.P.E. Dale, "The LinCMOS design manual," Texas Instruments, 1985, pp. 315-320.
  14. M.W.Pospieszalski, "Modeling of noise parameters of MESFETs and MODFETs and their frequency and temperature dependence," IEEE Trans, vol. MTT-37, no.9, 1989, pp. 1340-1350.
  15. R.K.Froelich, "An improved model for noise characterization of microwave GaAs FETs," IEEE Trans., vol.MTT-38, no.6, 1990, pp. 703-706.
  16. A. Podell, "A functional GaAs FET noise model," IEEE Trans., vol. ED-28, no.5, 1981, pp. 511-517.
  17. Y.S. Dai, Electronics on Noises (in Chinese). Shandong, China: Shandong Science & Technology Publishing House, 1997.

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