·Home
·Table of Contents
·Methods and Instrumentation

Scintillator-photodiode detecting systems for two-level X-ray inspection systems

V.D. Ryzhikov, N.G. Starzhinskiy, D.N. Kozin, L.P. Gal'chinetskii, V.P. Sochin, N.E.K.Lisetskaya, V.M.Svishch, A.D.Opolonin
STC for Radiiation Instruments, Concern "Institute for Singl Crystals",
Lenin Ave., 60, Kharkov,61001, Ukraine
Contact

Introduction

Criteria of scintillator choise for DM

Results and discussion

Conclusions

References

  1. Catalog.HEIMANN. X-RAY INSPECTION SYSTEM HL-SCAN 6040i.1999.
  2. Ryzhikov V.D., Stadnik P.E., Iakovlev Iu.A," Perspectives for scintillator-photodiode system ,"PTE, N2, pp. 6-16, 1984.
  3. Ryzhikov V.D., Semiconductors compounds A|| BV| scintillation crystals. Development, properties, use., NIITEHIM, Moscov, p.125, 1989.
  4. Atroschenko L.V. et. al. (Prof. Ryzhikov V.D. ed.), Scintillation crystals and radiation detectors on their, Naukova dumka, Kiev, p.312, 1998.
  5. obromyslov V.A., Rumiancev S.V., Radiation introscopy, Atomizdat, Moscov, p.352, 1972.
  6. V.D.Ryzihikov, N.C.Starzhinskiy, L.P.Golchinetsciy, A.A.Kist, E.K.Lisetskaya, L.L.Nagornaya, V.A.Tarasov, V.V.Chernicov. Effect of powerful ionizing radiations on optoelectronic properties of semiconductor and oxide scintillators. Materials of 10 the International Conference Radiation Physics and Chemistry, inorganic materials.(RFKh-10). Tomsk,,1999, pp.50-53.

© AIPnD , created by NDT.net |Home|    |Top|