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A Step Towards Automatic Defect Pattern Analysis and Evaluation in Industrial Radiography using Digital Image Processing

Hemanth Jagannathan, Narayana Bhaskar, P. Sriraman C.N., Vijay N.A.
Department of Electrical & Electronics Engineering, Sri Venkateswara College of Engineering, Sriperumbudur, Tamilnadu, India.
B. Venkatraman, P. Kalyanasundaram, Baldev Raj
Indira Gandhi Centre for Atomic Research, Kalpakkam-603 102
Contact

Abstract

Problem Specification

Conventional Radiographic System

Proposed Radiographic System

Development of Methodology for Automation

Artificial Neural Networks for Defect Detection

Multi-channel filtering for defect detection

Conclusion

References

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