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Design of a Novel detector for Industrial X-Ray Computed Tomography (XCT)

B. Wei W. Xian Y. S. Pan
Department of Optoelectronic Engineering,
University of Chongqing, Chongqing 400044, P.R.China
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Abstract

INTRODUCTION

DETECTOR DESCRIPTION

EXPERIMENTS AND RESULTS

Fig 3: This XCT image of a plastic/aluminum at 120kV Fig 4: This XCT image of a steel needle points on plastic circle at 120kV

CONCLUSIONS

ACKNOWLEDGMENTS

REFERENCE

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