- since 1996 -
A1525 Solo – the most compact and affordable TMF unit with two phased array transducers and 3D v
isualization and analysis software in standard delivery set. A compact, ergonomic and easy to handheld Phased Array unit based on Total Focusing Method for easy-going imaging of inspection objects with two-dimensional and three-dimensional visualization and evaluation of inspection results.
Teledyne ICM’s CPSERIES has been designed with a view to revolutionizing the handling and perfor
mances of portable X-Ray sets. Despite having managed to halve the weight of similar portable X-Ray generators available on the market (while continuing to provide the same power output), the SITEX CPSERIES generators feature a shutter, a laser pointer, a beryllium window, an aluminum filter and two integrated diaphragms (customized sizes are available upon request). Without compromising the robustness and reliability for which ICM products are renowned, the small size and light weight of the SITEX CPSERIES will radically change the way that you perform your RT inspections. And you will see a positive impact in terms of both quality and return on investment (ROI).
Eddy Current inspection : RotoETscan Rotating Head
The rotating head RotoETscan detects the presence of longitudinal surface or sub surface defects a
t high speed. The rotating head is often installed directly on the production line. It is generally dedicated to the control of long products such as tubes, bars and wires, made of ferrous or non-ferrous material. It can also be used for inspection of small parts (billets).
Robotic laser shearography enables 100% inspection of complex, flight-critical composite structures
An article in “Composites World Magazine” showcases Non Destructive Testing of aero-structures
with Laser Shearography. Over the years Dantec Dynamics has supplied many solutions for the aerospace industry. Referring to specific customer projects several of these cases are examined to outline the advantages of using Laser Shearography for automated defect detection.