- since 1996 -
FD800 Bench Top Flaw Detectors
The bench-top FD800 flaw detector range combines state-of-the-art flaw detection with advanced mater
ial thickness capabilities. Designed for use in the laboratory these gauges are the tool you need for all your flaw detecting needs.
Combination of Digital Image Correlation and Thermographic Measurements
The combination of measuring results from the digital image correlation (ARAMIS, DIC) and temperat
ure measuring data from infrared cameras permits the simultaneous analysis of the thermal and mechanical behavior of test specimens in the materials and components testing field.
Pulse thermography is a non-contact test method that is ideal for the characterization of thin fil
ms and coatings or the detection of defects. With a remarquable short test time and a high detection sensitivity, the Telops TESTD-PT is the perfect tool for non- destructive testing. With such high frame rates, it is even possible to investigate highly conductive or diffusive materials.
Surf-X® Array Probe
Introducing the Surf-X family of flexible Eddy Current Array (ECA) probes. Featuring unique multiple
coil sets and proprietary X-PROBE technology, Surf-X array probes can quickly and accurately handle a range of inspection applications, from inspecting corrosion or cracking in pipes, pressure vessels, or tanks, to assessing and sizing cracks in raised welds and friction stir welds.