- since 1996 -
nanoVoxel series has nano-scale resolution upto 500nm by using high voltage X-ray source (from 80-
300 kV) with micro/nano focal spot and highly sensitive flat panel detectors and unique Optical coupling detector.
NDT.net launches mobile-friendly design
NDT.net has revamped its website providing a mobile-friendly design.The front page received a comp
letely new design and all other sections are now reacting responsively on mobile devices. This has been a major step to make our website more user- friendly.
HARDNESS TESTER TKM-459CE combi
TKM-459CE combi applies 2 methods of hardness control: UCI and Leeb. It provides high-accuracy tes
ting of metals and alloys as well as items of different sizes and configurations, their hardened layers and galvanic coatings. Device represents results in HB, HRC, HV and others. Shock-, dust- and water-proof housing with intuitive software make this gauge easy to use in all working conditions.
Research and Application Development For NDT
Acuren’s Research and Application Development specializes in the development of advanced ultraso
nic inspection techniques and systems for challenging inspection applications, with an emphasis on practical solutions which are field deployable. Services include manual and automated ultrasonic inspection system development, inspection technique optimization using laboratory scale studies and ultrasonic modeling (CIVA, BeamTool), preparing technical justification for technique evaluation and qualification (Probability of Detection and sizing accuracy studies), inspection/calibration/analysis procedure preparation to support field deployment of custom techniques, and development of custom imaging algorithms to support challenging inspection applications.