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where expertise comes together
- since 1996 -
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David Saunders
David Saunders
03:46 Feb-09-2009
UT,RT,PT,MT,technician

Job Location: worldwide

Enquiring about posistions available worldwide or Australia and Africa preferred

 
 

Product Spotlight

NDT Master Lecturer

In the program both university professors and practitioners will give lectures, which guarantees the
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oretical depth and practical inside. Academic Director: Prof. Dr. Christian Boller
The following lecturers are not complete: Prof. Tadeusz Stepinski, Prof. Wieslaw Staszewski, Prof. Frank Walther, Prof. Giovanni Bruno, Prof. Gerd Dobmann, Prof. Philippe Guy
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NEW - TD Focus-ScanRX

The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
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ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
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NOVO Armor 15 & NOVO Armor 22

The Armor Kit Contains the NOVO Armor, which provides additional mechanical protection to the NOVO 1
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5WN & NOVO 22WN Detectors, the Armor Stand and a traveling soft cover. - Newest shock absorbent technology case - Water resistant design - Supports wired & wireless communication - Multiple positioning options - Tripod connection using the Built-in 1/4” threads - Simple Detector battery replacement
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FMC/TFM

Next generation for Phased Array UT is here now with FMC/TFM! Have higher resolution imaging, impr
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oved signal to noise ratio, characterize, size and analyze defects better with access to several wave mode views and save raw FMC data for higher quality analysis.  Some of the benefits are:
  • Beautiful Image! Easier to understand what you're looking at
  • Completely focused in entire image or volume
  • Much easier to define setups before inspection
  • Easier to decipher geometry echoes from real defects
  • Oriented defects (e.g. cracks) are imaged better
  • See image from different wave modes from one FMC inspection
  • FMC data can be reprocessed/analyzed without going back to the field
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