- since 1996 -
Research and Applications Development For NDT
The Research and Applications Development (RAD) group is a newly formed team within Acuren dedicat
ed to tackling challenging inspection problems. Our focus is the development of novel, field deployable, advanced inspection techniques for use in cases where standard NDT methods are ineffective. We don't wait for new innovations, we engineer them. From concept to commissioning.
HARDNESS TESTER TKM-459CE combi
TKM-459CE combi applies 2 methods of hardness control: UCI and Leeb. It provides high-accuracy tes
ting of metals and alloys as well as items of different sizes and configurations, their hardened layers and galvanic coatings. Device represents results in HB, HRC, HV and others. Shock-, dust- and water-proof housing with intuitive software make this gauge easy to use in all working conditions.
ISAFE3 Intrinsically Safe Sensor System
ISAFE3 intrinsically safe sensor system of Vallen Systeme is especially targeted at the petrochemica
l - as well as oil and gas transportation industry. The sensor system is designed for permanent monitoring or periodic inspection tasks. Sensors are available for different AE-frequency ranges optimized for corrosion and fatigue crack detection and other applications. The ISAFE 3 sensor system consists of an AE-sensor (model ISAS3) certified according to ATEX/IEC for installation in zone 0, gas group IIC, IP68, 20 to +60 °C, and a signal isolator (model SISO3) certified for installation in zone 2. An ISAS3 sensor can be mounted in atmosphere or submerged, e.g. in water or crude oil. It is supported by mounting tools for temporary (magnets) or permanent (welded) installation. ISAFE3 supports automatic sensor coupling test and can be used with any AE signal processor supporting 28V supply at 90 mA peak, e.g. Vallen Systeme ASIP-2/A.
YXLON Cougar EVO
Scalable small footprint X-ray inspection systems for assembly and laboratory applications. The
YXLON Cougar EVO series was designed to provide the "best-in- class" inspection solutions for SMT, semiconductor, and laboratory assembly applications, while maintaining a small system footprint for maximum convenience. With optimized software and hardware, these systems produce higher quality and more consistent results than other electronics inspection systems currently on the market.