- since 1996 -
Webinar: A better way to inspect for surface and sub-surface cracking
Zetec to host webinar November 7 on a better way to inspect for surface and sub-surface cracking. In
this webinar, we will introduce a better method that offers industry-leading portability and flexibility, while delivering exceptional flaw detection. The webinar will review and demonstrate how this solution can be applied across numerous inspection applications. Register today!
HD-CR 35 NDT Computed Radiography System
Portable high-resolution CR scanner for all radiography applications - weld testing, profile images
and aerospace. No matter what type of radiographic testing you are performing, the unique TreFoc Technology of the HD-CR 35 NDT imaging plate scanner always guarantees the highest image quality.
NEW - TD Focus-ScanRX
The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
FAAST-PA! OEM Patented phased Array for high speed UT inspection
Multiangle, Multifocus, Multifrequency, Multibeam. Instead of stacking UT electronics and having m
any PA probes, FAAST-PA is able to transmit all delay laws within ONE single shot in Real time.