where expertise comes together
- since 1996 -
- since 1996 -
Combination of Digital Image Correlation and Thermographic Measurements
The combination of measuring results from the digital image correlation (ARAMIS, DIC) and temperat
ure measuring data from infrared cameras permits the simultaneous analysis of the thermal and mechanical behavior of test specimens in the materials and components testing field.
nanoVoxel series has nano-scale resolution upto 500nm by using high voltage X-ray source (from 80-
300 kV) with micro/nano focal spot and highly sensitive flat panel detectors and unique Optical coupling detector.
CIVA 2020 UT Module
CIVA NDE Simulation Software is the world leader of NDT Simulation. The UT simulation Module incl
udes: - "Beam computation": Beam propagation simulation - "Inspection Simulation": Beam interaction with flaws or specimens The user can simulate a whole inspection process (pulse echo, tandem or TOFD) with a wide range of probes (conventional, Phased- arrays or EMAT), components, and flaws.
OPBOX with standard software is able to do all types of inspections and measurements: flaw detection in welds and materials, scanning of objects, testing composite materials, forged and moulded pieces, many UT inspections, measurements of properties of ma
Typical applications: UT measurements with pulse technique, Measurement of thicknesses also at hig
h temperatures, Measurements of properties of materials, including fluids and gases We are delivering a standard version of the software (for any Microsoft Windows up to 10 x64 with Microsoft Hardware certification report Approved) and for special needs: SDK with ready to use examples for LabView, MATLAB x64, C++ wrapper for dll, Python and Linux., and also low-level description of how to control our devices directly from any USB tools