- since 1996 -
NEOS III is Logos Imagings lightest DR system. With a built-in battery and internal wireless commu
nication, the NEOS III is perfect for users that want to quickly assess an item.
Combination of Digital Image Correlation and Thermographic Measurements
The combination of measuring results from the digital image correlation (ARAMIS, DIC) and temperat
ure measuring data from infrared cameras permits the simultaneous analysis of the thermal and mechanical behavior of test specimens in the materials and components testing field.
GEKKO - Portable Phased Array Testing with TFM in Real-Time
The portable phased array testing system GEKKO provides 64 parallel test channels. On creating testi
ng parameters the operator is assisted by the CIVA software. Due to its modular set-up the GEKKO instrument is suitable for operators of all skill levels.
Surf-X® Array Probe
Introducing the Surf-X family of flexible Eddy Current Array (ECA) probes. Featuring unique multiple
coil sets and proprietary X-PROBE technology, Surf-X array probes can quickly and accurately handle a range of inspection applications, from inspecting corrosion or cracking in pipes, pressure vessels, or tanks, to assessing and sizing cracks in raised welds and friction stir welds.