where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -

430 views
Technical Discussions
Yoseph Bar-Cohen
R & D,
Jet Propulsion Lab (JPL), USA, Joined Nov 1998, 26

Yoseph Bar-Cohen

R & D,
Jet Propulsion Lab (JPL),
USA,
Joined Nov 1998
26
03:11 Mar-01-2002
2002 Transducing Materials and Devices -- Call for Papers

Dear Colleague,

I am pleased to inform you of the first Transducing Materials and Devices Conference and I would like to invite you to submit an abstract. This international conference is an exciting opportunity for technical interactions and information exchange among developers and users of this multidisciplinary field that is very important to many areas of science and engineering. The conference is going to be held on Oct. 31 - Nov. 1, 2002 at Brugge, Belgium, and it is described on: http://spie.org/conferences/calls/02/epf/confs/PF11.html . This conference is part of the SPIE's Photonics Fabrication Europe Symposium, which is described on http://spie.org/conferences/calls/02/epf/

Submittal of abstracts is due on April 1, 2002 and the manuscript will be due on September 30, 2002. The Abstract Submission Form is available on http://butler2.spie.org/abstracts/Absin.lasso?-token=PF11

Yosi , Conference Chair
_____________________________________________________
Yoseph Bar-Cohen, Ph.D., Senior Research Scientist
Group Leader, NDEAA Technologies, M&RT
Adjunct Professor, UCLA, MAE Dept.
Jet Propulsion Lab (JPL), 82-105
4800 Oak Grove Dr., Pasadena, CA 91109-8099
818-354-2610, Fax: 818-393-3254
yosi@jpl.nasa.gov http://ndeaa.jpl.nasa.gov
-------------------------------------



 
 Reply 
 

Product Spotlight

Micro CT

nanoVoxel series has nano-scale resolution upto 500nm by using high voltage X-ray source (from 80-
...
300 kV) with micro/nano focal spot and highly sensitive flat panel detectors and unique Optical coupling detector.
>

FD800 Bench Top Flaw Detectors

The bench-top FD800 flaw detector range combines state-of-the-art flaw detection with advanced mater
...
ial thickness capabilities. Designed for use in the laboratory these gauges are the tool you need for all your flaw detecting needs.
>

VeeScan AirCraft Wheel Inspection

The VEESCAN offers maximum flexibility, has a proven mechanical design and records of breakdown-fr
...
ee operation of over 365 days. Appealing to companies in the Aerospace industry, the VEESCAN is ideal for all wheel-testing environments. With a wide selection of probes, the VeeScan allows your wheel testing facility the flexibility to select the most compatible configurations with their workload.
>

OPBOX with standard software is able to do all types of inspections and measurements: flaw detection in welds and materials, scanning of objects, testing composite materials, forged and moulded pieces, many UT inspections, measurements of properties of ma

Typical applications: UT measurements with pulse technique, Measurement of thicknesses also at hig
...
h temperatures, Measurements of properties of materials, including fluids and gases We are delivering a standard version of the software (for any Microsoft Windows up to 10 x64 with Microsoft Hardware certification report Approved) and for special needs: SDK with ready to use examples for LabView, MATLAB x64, C++ wrapper for dll, Python and Linux., and also low-level description of how to control our devices directly from any USB tools
>

Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window