- since 1996 -
ScanMaster ultrasonic immersion systems are designed for high throughput, multi shift operation in a
n industrial or lab environment. These fully integrated systems provide various scanning configurations and incorporate conventional and phased arrays technologies to support diverse applications, such as inspection of disks, bars, shafts, billets and plates. All of ScanMaster immersion systems are built from high accuracy scanning frames allowing for scanning of complex parts and include a multi-channel ultrasonic instrument with exceptional performance. The systems are approved by all major manufacturers for C-scan inspection of jet engine forged discs. Together with a comprehensive set of software modules these flexible series of systems provide the customer with the best price performance solutions.
HARDNESS TESTER TKM-459CE combi
TKM-459CE combi applies 2 methods of hardness control: UCI and Leeb. It provides high-accuracy tes
ting of metals and alloys as well as items of different sizes and configurations, their hardened layers and galvanic coatings. Device represents results in HB, HRC, HV and others. Shock-, dust- and water-proof housing with intuitive software make this gauge easy to use in all working conditions.
Varex Imaging Large Field of View (FOV) Digital Detector Arrays (DDAs)
A larger FOV DDA can reduce the space and volume of the X-ray inspection system on the factory floor
, enable faster scanning times, better throughput and better resolution images at a lower dose. Customers can also save time and money. With these benefits in mind, Varex Imaging has designed a family of large FOV detectors (4343HE, XRD 1611, 4343DX-I, 4343CT) for our industrial imaging customers.
NDT Master Lecturer
In the program both university professors and practitioners will give lectures, which guarantees the
oretical depth and practical inside. Academic Director: Prof. Dr. Christian Boller
The following lecturers are not complete: Prof. Tadeusz Stepinski, Prof. Wieslaw Staszewski, Prof. Frank Walther, Prof. Giovanni Bruno, Prof. Gerd Dobmann, Prof. Philippe Guy