- since 1996 -
HARDNESS TESTER TKM-459CE combi
TKM-459CE combi applies 2 methods of hardness control: UCI and Leeb. It provides high-accuracy tes
ting of metals and alloys as well as items of different sizes and configurations, their hardened layers and galvanic coatings. Device represents results in HB, HRC, HV and others. Shock-, dust- and water-proof housing with intuitive software make this gauge easy to use in all working conditions.
IntraPhase Athena Phased Array System
The Athena Phased Array system, manufactured by WesDyne NDE Products & Technology, consists of a pha
sed array acquisition system and PC running IntraSpect software. A PC is used to perform acquisition, analysis and storage of the data. System hardware is capable of operating up to four data sets with any combination of phased array or conventional UT probes. NOW AVAILABLE IN 64-64 CONFIGURATION.
Varex Imaging Large Field of View (FOV) Digital Detector Arrays (DDAs)
A larger FOV DDA can reduce the space and volume of the X-ray inspection system on the factory floor
, enable faster scanning times, better throughput and better resolution images at a lower dose. Customers can also save time and money. With these benefits in mind, Varex Imaging has designed a family of large FOV detectors (4343HE, XRD 1611, 4343DX-I, 4343CT) for our industrial imaging customers.
NEOS III is Logos Imagings lightest DR system. With a built-in battery and internal wireless commu
nication, the NEOS III is perfect for users that want to quickly assess an item.