- since 1996 -
Research and Applications Development For NDT
The Research and Applications Development (RAD) group is a newly formed team within Acuren dedicat
ed to tackling challenging inspection problems. Our focus is the development of novel, field deployable, advanced inspection techniques for use in cases where standard NDT methods are ineffective. We don't wait for new innovations, we engineer them. From concept to commissioning.
NDT Master Lecturer
In the program both university professors and practitioners will give lectures, which guarantees the
oretical depth and practical inside. Academic Director: Prof. Dr. Christian Boller
The following lecturers are not complete: Prof. Tadeusz Stepinski, Prof. Wieslaw Staszewski, Prof. Frank Walther, Prof. Giovanni Bruno, Prof. Gerd Dobmann, Prof. Philippe Guy
NEW - TD Focus-ScanRX
The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
Surf-X® Array Probe
Introducing the Surf-X family of flexible Eddy Current Array (ECA) probes. Featuring unique multiple
coil sets and proprietary X-PROBE technology, Surf-X array probes can quickly and accurately handle a range of inspection applications, from inspecting corrosion or cracking in pipes, pressure vessels, or tanks, to assessing and sizing cracks in raised welds and friction stir welds.