- since 1996 -
FD800 Bench Top Flaw Detectors
The bench-top FD800 flaw detector range combines state-of-the-art flaw detection with advanced mater
ial thickness capabilities. Designed for use in the laboratory these gauges are the tool you need for all your flaw detecting needs.
OmniScan™ X3 flaw detector
The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, like total focus
ing method (TFM) images and advanced visualization capabilities, enable you to complete your inspection with greater confidence.
NDTkit RT, TESTIA's Digital Radiography software The NDTkit product line software for X-ray analysi
s. NDTkit RT is a software benefiting from the Ultis kernel which is dedicated to radiographic image analysis. It offers a set of tools and filtering processes to assist RT operators in finding relevant flaws.
The all-digital Novascope 6000 is a portable, ultra-high precision thickness gauge for high-speed
thickness measurement. Novascope 6000 has unmatched capabilities and unique features including: •Superior Resolution with high contrast, high-speed color RF display •High pulser voltage •Real-time video output •Increased internal/external data storage •Programmable SetUp features •Battery & AC Powered