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- since 1996 -

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Job Offers
Shivam singh
Other, Site incharge (B. A. R. C L2)
N. D. T division , India, Joined Mar 2018, 2

Shivam singh

Other, Site incharge (B. A. R. C L2)
N. D. T division ,
India,
Joined Mar 2018
2
21:21 Dec-21-2019
R.S.O

Posted by N.D.T DIVISION
Job Location: Gujarat, Rajasthan

Looking for RSO who can join immediately

Location : GUJARAT, RAJASTHAN.

Any graduate with BARC level 2 certificate.

 
 

Product Spotlight

CIVA 2020 UT Module

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udes: - "Beam computation": Beam propagation simulation - "Inspection Simulation": Beam interaction with flaws or specimens The user can simulate a whole inspection process (pulse echo, tandem or TOFD) with a wide range of probes (conventional, Phased- arrays or EMAT), components, and flaws.
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TESTD-PT SYSTEM

Pulse thermography is a non-contact test method that is ideal for the characterization of thin fil
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ms and coatings or the detection of defects. With a remarquable short test time and a high detection sensitivity, the Telops TESTD-PT is the perfect tool for non- destructive testing. With such high frame rates, it is even possible to investigate highly conductive or diffusive materials.
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Research and Application Development For NDT

Acuren’s Research and Application Development specializes in the development of advanced ultraso
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nic inspection techniques and systems for challenging inspection applications, with an emphasis on practical solutions which are field deployable. Services include manual and automated ultrasonic inspection system development, inspection technique optimization using laboratory scale studies and ultrasonic modeling (CIVA, BeamTool), preparing technical justification for technique evaluation and qualification (Probability of Detection and sizing accuracy studies), inspection/calibration/analysis procedure preparation to support field deployment of custom techniques, and development of custom imaging algorithms to support challenging inspection applications.
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NEW - TD Focus-ScanRX

The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
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ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
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