- since 1996 -
OmniScan™ X3 flaw detector
The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, like total focus
ing method (TFM) images and advanced visualization capabilities, enable you to complete your inspection with greater confidence.
nanoVoxel series has nano-scale resolution by using high voltage X-ray source (from 80-300 kV) wit
h micro focal spot and highly sensitive detector including different kinds of big size panel detectors and lens coupling CCD.
Research and Application Development For NDT
Acuren’s Research and Application Development specializes in the development of advanced ultraso
nic inspection techniques and systems for challenging inspection applications, with an emphasis on practical solutions which are field deployable. Services include manual and automated ultrasonic inspection system development, inspection technique optimization using laboratory scale studies and ultrasonic modeling (CIVA, BeamTool), preparing technical justification for technique evaluation and qualification (Probability of Detection and sizing accuracy studies), inspection/calibration/analysis procedure preparation to support field deployment of custom techniques, and development of custom imaging algorithms to support challenging inspection applications.
Cygnus 6+ PRO Multi-Mode Ultrasonic Thickness Gauge
The Cygnus 6+ PRO thickness gauge is the most advance gauge within the Cygnus range with key featu
res including: comprehensive data logging; A-scan and B-scan display; manual gain control; Bluetooth connectivity; and much more. With its unique dual display and three measuring modes (Multiple-Echo, Echo-Echo and Single-Echo), this surface thickness gauge offers maximum versatility for inspections.