where expertise comes together
- since 1996 -
- since 1996 -
Content on Demand by Eddyfi Technologies
Finding yourself in front of a screen practicing safe social distancing instead of out in the fiel
d? At Eddyfi Technologies, we are doing our part in helping you be better prepared for what comes next. We introduce to you Eddyfi on Demand. Fill your schedule with webinars, how-to videos, informative technical papers and our NEW addition: Eddyfi Academy. There, you will have access to FREE online courses and obtain certificates of attendance once completed in order for you to include these e-learning sessions in your log of required training hours. Join us today. Stay safe, stay Beyond Current.
FD800 Bench Top Flaw Detectors
The bench-top FD800 flaw detector range combines state-of-the-art flaw detection with advanced mater
ial thickness capabilities. Designed for use in the laboratory these gauges are the tool you need for all your flaw detecting needs.
HARDNESS TESTER TKM-459CE combi
TKM-459CE combi applies 2 methods of hardness control: UCI and Leeb. It provides high-accuracy tes
ting of metals and alloys as well as items of different sizes and configurations, their hardened layers and galvanic coatings. Device represents results in HB, HRC, HV and others. Shock-, dust- and water-proof housing with intuitive software make this gauge easy to use in all working conditions.
Research and Application Development For NDT
Acuren’s Research and Application Development specializes in the development of advanced ultraso
nic inspection techniques and systems for challenging inspection applications, with an emphasis on practical solutions which are field deployable. Services include manual and automated ultrasonic inspection system development, inspection technique optimization using laboratory scale studies and ultrasonic modeling (CIVA, BeamTool), preparing technical justification for technique evaluation and qualification (Probability of Detection and sizing accuracy studies), inspection/calibration/analysis procedure preparation to support field deployment of custom techniques, and development of custom imaging algorithms to support challenging inspection applications.