where expertise comes together
- since 1996 -
- since 1996 -
NDTkit RT, TESTIA's Digital Radiography software The NDTkit product line software for X-ray analysi
s. NDTkit RT is a software benefiting from the Ultis kernel which is dedicated to radiographic image analysis. It offers a set of tools and filtering processes to assist RT operators in finding relevant flaws.
NOVO Armor 15 & NOVO Armor 22
The Armor Kit Contains the NOVO Armor, which provides additional mechanical protection to the NOVO 1
5WN & NOVO 22WN Detectors, the Armor Stand and a traveling soft cover. - Newest shock absorbent technology case - Water resistant design - Supports wired & wireless communication - Multiple positioning options - Tripod connection using the Built-in 1/4” threads - Simple Detector battery replacement
UCI Hardness Tester NOVOTEST T-U2
UCI hardness tester NOVOTEST T-U2 is is used for non-destructive hardness testing of: metals and
alloys by scales of hardness: Rockwell (HRC), Brinell (HB), Vickers (HV); non-ferrous metals, alloys of iron etc., and using five additional scales for calibration; with tensile strength (Rm) scale determines the tensile strength of carbon steel pearlitic products by automatic recalculation from Brinell (HB) hardness scale.
Research and Application Development For NDT
Acuren’s Research and Application Development specializes in the development of advanced ultraso
nic inspection techniques and systems for challenging inspection applications, with an emphasis on practical solutions which are field deployable. Services include manual and automated ultrasonic inspection system development, inspection technique optimization using laboratory scale studies and ultrasonic modeling (CIVA, BeamTool), preparing technical justification for technique evaluation and qualification (Probability of Detection and sizing accuracy studies), inspection/calibration/analysis procedure preparation to support field deployment of custom techniques, and development of custom imaging algorithms to support challenging inspection applications.