- since 1996 -
NDT Master Lecturer
In the program both university professors and practitioners will give lectures, which guarantees the
oretical depth and practical inside. Academic Director: Prof. Dr. Christian Boller
The following lecturers are not complete: Prof. Tadeusz Stepinski, Prof. Wieslaw Staszewski, Prof. Frank Walther, Prof. Giovanni Bruno, Prof. Gerd Dobmann, Prof. Philippe Guy
NEW - TD Focus-ScanRX
The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
TSC Amigo2 - ACFM technology has developed a solid reputation for accurately detecting and sizing
surface-breaking cracks through paint and coatings. As the industry demands increased performance in speed, signal quality, and portability, it’s time for an evolution. It’s time for Amigo2.
NEOS III is Logos Imagings lightest DR system. With a built-in battery and internal wireless commu
nication, the NEOS III is perfect for users that want to quickly assess an item.