- since 1996 -
NEW - TD Focus-ScanRX
The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
OmniScan™ X3 flaw detector
The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, like total focus
ing method (TFM) images and advanced visualization capabilities, enable you to complete your inspection with greater confidence.
HARDNESS TESTER TKM-459CE combi
TKM-459CE combi applies 2 methods of hardness control: UCI and Leeb. It provides high-accuracy tes
ting of metals and alloys as well as items of different sizes and configurations, their hardened layers and galvanic coatings. Device represents results in HB, HRC, HV and others. Shock-, dust- and water-proof housing with intuitive software make this gauge easy to use in all working conditions.
NDT Master Lecturer
In the program both university professors and practitioners will give lectures, which guarantees the
oretical depth and practical inside. Academic Director: Prof. Dr. Christian Boller
The following lecturers are not complete: Prof. Tadeusz Stepinski, Prof. Wieslaw Staszewski, Prof. Frank Walther, Prof. Giovanni Bruno, Prof. Gerd Dobmann, Prof. Philippe Guy