- since 1996 -
FD800 Bench Top Flaw Detectors
The bench-top FD800 flaw detector range combines state-of-the-art flaw detection with advanced mater
ial thickness capabilities. Designed for use in the laboratory these gauges are the tool you need for all your flaw detecting needs.
Teledyne ICM’s CPSERIES has been designed with a view to revolutionizing the handling and perfor
mances of portable X-Ray sets. Despite having managed to halve the weight of similar portable X-Ray generators available on the market (while continuing to provide the same power output), the SITEX CPSERIES generators feature a shutter, a laser pointer, a beryllium window, an aluminum filter and two integrated diaphragms (customized sizes are available upon request). Without compromising the robustness and reliability for which ICM products are renowned, the small size and light weight of the SITEX CPSERIES will radically change the way that you perform your RT inspections. And you will see a positive impact in terms of both quality and return on investment (ROI).
Research and Application Development For NDT
Acuren’s Research and Application Development specializes in the development of advanced ultraso
nic inspection techniques and systems for challenging inspection applications, with an emphasis on practical solutions which are field deployable. Services include manual and automated ultrasonic inspection system development, inspection technique optimization using laboratory scale studies and ultrasonic modeling (CIVA, BeamTool), preparing technical justification for technique evaluation and qualification (Probability of Detection and sizing accuracy studies), inspection/calibration/analysis procedure preparation to support field deployment of custom techniques, and development of custom imaging algorithms to support challenging inspection applications.
Compact NDT inspection-heads for measurements with active thermography
The compact inspection head is suitable for thermographic ndt tasks. The uncooled infrared camera
is specially developed for NDI-tasks and offers a thermal sensitivity until now known only from thermal imagers with cooled detector. All required components and functions are integrated into the inspection-head. You will only need an ethernet cable to connect the sensor with the evaluation system.