- since 1996 -
HD-CR 35 NDT Computed Radiography System
Portable high-resolution CR scanner for all radiography applications - weld testing, profile images
and aerospace. No matter what type of radiographic testing you are performing, the unique TreFoc Technology of the HD-CR 35 NDT imaging plate scanner always guarantees the highest image quality.
nanoVoxel series has nano-scale resolution upto 500nm by using high voltage X-ray source (from 80-
300 kV) with micro/nano focal spot and highly sensitive flat panel detectors and unique Optical coupling detector.
Pulse thermography is a non-contact test method that is ideal for the characterization of thin fil
ms and coatings or the detection of defects. With a remarquable short test time and a high detection sensitivity, the Telops TESTD-PT is the perfect tool for non- destructive testing. With such high frame rates, it is even possible to investigate highly conductive or diffusive materials.
Typical Phased Array probes have frequencies between 1MHz and 20MHz and the number of wafers is 10
to 128. M2 Electronics offers customers conventionally ultrasound probes and the ability to provide high-precision Phased Array Ultrasound Probes of up to 256 wafers. We can also customize the probe for our customers to meet the specific application requirements of the user.