where expertise comes together
- since 1996 -
- since 1996 -
Compact NDT inspection-heads for measurements with active thermography
The compact inspection head is suitable for thermographic ndt tasks. The uncooled infrared camera
is specially developed for NDI-tasks and offers a thermal sensitivity until now known only from thermal imagers with cooled detector. All required components and functions are integrated into the inspection-head. You will only need an ethernet cable to connect the sensor with the evaluation system.
Webinar: A better way to inspect for surface and sub-surface cracking
Zetec to host webinar November 7 on a better way to inspect for surface and sub-surface cracking. In
this webinar, we will introduce a better method that offers industry-leading portability and flexibility, while delivering exceptional flaw detection. The webinar will review and demonstrate how this solution can be applied across numerous inspection applications. Register today!
Lyft™: Pulsed Eddy Current Reinvented
PEC Reinvented—CUI Programs Redefined Corrosion under insulation (CUI) is possibly the greatest u
nresolved asset integrity problem in the industry. Current methods for measuring wall thickness with liftoff, without removing insulation, all have severe limitations. Eddyfi introduces Lyft — a reinvented, high-performance pulsed eddy current (PEC) solution. The patent- pending system features a state-of-the-art portable instrument, real- time C-scan imaging, fast data acquisition with grid-mapping and dynamic scanning modes, and flexibility with long cables. It can also scan through thick metal and insulation, as well as aluminum, stainless steel, and galvanized steel weather jackets. Who else but Eddyfi to reinvent an eddy current technique and redefine CUI programs. Got Lyft?
FD800 Bench Top Flaw Detectors
The bench-top FD800 flaw detector range combines state-of-the-art flaw detection with advanced mater
ial thickness capabilities. Designed for use in the laboratory these gauges are the tool you need for all your flaw detecting needs.