where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -

LECOEUR ELECTRONIQUE
The Specialist of electronics for ultrasonic testing.

772 views
Career Discussions
Ed
Ed
03:06 Feb-26-2005
CP-189

Does CP-189 require a J-1 Near Vision eye examination for certification or is a J-2 sufficient?


    
 
 
N.Kuppusamy
Consultant, NDT Level-III Engineer
Advanced Inspection & Testing (S) Pte Ltd, Singapore, Joined Dec 2003, 34

N.Kuppusamy

Consultant, NDT Level-III Engineer
Advanced Inspection & Testing (S) Pte Ltd,
Singapore,
Joined Dec 2003
34
03:08 Feb-27-2005
Re: CP-189
Hi,
Near vision requirement for certification according to CP 189 is J1. J2 is suffiecient only for SNT-TC-1A.
Regards,
N.Kuppusamy
----------- Start Original Message -----------
: Does CP-189 require a J-1 Near Vision eye examination for certification or is a J-2 sufficient?
------------ End Original Message ------------




    
 
 
Ed
Ed
05:16 Feb-27-2005
Re: CP-189
----------- Start Original Message -----------
: Hi,
: Near vision requirement for certification according to CP 189 is J1. J2 is suffiecient only for SNT-TC-1A.
: Regards,
: N.Kuppusamy
: : Does CP-189 require a J-1 Near Vision eye examination for certification or is a J-2 sufficient?
------------ End Original Message ------------

Thakns. Thats what I thought, but couldn't find my copy of CP-189.


    
 
 
Ed
Ed
05:17 Feb-27-2005
Re: CP-189
----------- Start Original Message -----------
: Hi,
: Near vision requirement for certification according to CP 189 is J1. J2 is suffiecient only for SNT-TC-1A.
: Regards,
: N.Kuppusamy
: : Does CP-189 require a J-1 Near Vision eye examination for certification or is a J-2 sufficient?
------------ End Original Message ------------

Thank
s. Thats what I thought, but couldn't find my copy of CP-189.


    
 
 

Product Spotlight

TOPAZ® 64: Fully Integrated Portable 64 Channel PAUT Instrument with FMC & TFM

Introducing TOPAZ64, the industry’s most intelligent fully integrated, portable 64-channel phased
...
array ultrasound (UT) instrument. TOPAZ64 combines code-compliant phased array UT with the industry’s most advanced full matrix capture (FMC) and total focusing method (TFM) capabilities. Featuring the highest acquisition frequency in its class, high resolution FMC and a 12” multi-touchscreen, users can easily visualize even the smallest flaws. TOPAZ64 can generate a bipolar pulse that provides more acoustic energy versus previous models for punching through thick components. The result is a portable tool that delivers increased inspection coverage, more accurate signals, and the ability to handle all UT inspections in one package. TOPAZ64 is ideal for challenging applications in transportation, oil and gas, manufacturing and power generation.
>

MUSE Mobile Ultrasonic Equipment

The MUSE, a portable ultrasonic imaging system, was developed for in-field inspections of light-weig
...
ht structures. The MUSE consists of a motor-driven manipulator, a water circulation system for the acoustic coupling and a portable ultrasonic flaw detector (USPC 3010). The MUSE provides images of internal defects (A-, B-,C- and D-scan).
>

Varex Imaging Large Field of View (FOV) Digital Detector Arrays (DDAs)

A larger FOV DDA can reduce the space and volume of the X-ray inspection system on the factory floor
...
, enable faster scanning times, better throughput and better resolution images at a lower dose. Customers can also save time and money. With these benefits in mind, Varex Imaging has designed a family of large FOV detectors (4343HE, XRD 1611, 4343DX-I, 4343CT) for our industrial imaging customers.
>

NDT Master Lecturer

In the program both university professors and practitioners will give lectures, which guarantees the
...
oretical depth and practical inside. Academic Director: Prof. Dr. Christian Boller
The following lecturers are not complete: Prof. Tadeusz Stepinski, Prof. Wieslaw Staszewski, Prof. Frank Walther, Prof. Giovanni Bruno, Prof. Gerd Dobmann, Prof. Philippe Guy
>

Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window