Call for Papers: NDT of Smart Materials and Nanotechnology (SMN 2007 Harbin, China)
Call for Papers and Announcement International Conference on Smart Materials and Nanotechnology in Engineering
1st July-4th July, 2007, Harbin, China
Organized by Harbin Institute of Technology, China
Theme: Non-Destructive Testing Applications
Theme Chair: Brian Stephen Wong and Rolf Diederichs
Smart Materials and smart structures are being utilized much more in Non-Destructive Testing (NDT) applications particularly in the aerospace industry. For example defects such as cracks are being detected by systems using multiple sensors on aircraft structures and many phased array ultrasonic systems are being developed and used for critical aircraft inspections. There is also increasing interest in structural health monitoring by using embedded sensors in aerospace or civil structures.
Papers are sought which focus on defect detection in structures using piezoelectric, electromagnetic or other types of smart sensors. Although emphasis will be on aircraft structures other applications are also welcome.
The conference proceedings will be published by SPIE, and Non-Destructive Testing Papers will be also published in NDT.net.
Abstract Due Date: 28 October 2006
Manuscript Due Date: 19 March 2007
All abstracts to be submitted electronically to (include theme in abstract):
Smart@hit.edu.cn (Preferred) or Smart_hit2007@yahoo.com.cn
Dr. Fuhong Dai
PO Box 3011, No.2 Yikuang Street,
Centre for Composite Materials and Structures,
HIT Science Park, Harbin Institute of Technology,
Harbin 150080,PR China
Tel: +0086-451-86414145, +0086-451-86402328, Fax: +0086-451-86402343