My colleague David and I chair a technical committee (36 Industrial Inspection) of the IEEE Instrumentation and Measurement Society (I&M). We are planning a workshop at the 17th WCNDT (Shanghai or a city nearby).
We want to focus on two major topics: 1) Standards and applications of smart sensors We may want to discuss how the the IEEE 1451 standards &TEDS work for NDT&E applications.
2) The NDT data format We may want to discuss the ASTM DICONDE format. How does it work for NDT instrument and software implementation? Do we need a standard for NDT data besides images? How do we timestamps the NDT data? How do we benefit from a NDT data standard? Does the standard help NDT data analysis and software development?
We may want to have a participant list and further find out if we need to create a working group on these standards.
If you are going to attend WCNDT 17, you may also want to give us your opinions on these topics as well. You can post your opinions here or just send us an email. Let's see what we can contribute to this field together.