- since 1996 -
FD800 Bench Top Flaw Detectors
The bench-top FD800 flaw detector range combines state-of-the-art flaw detection with advanced mater
ial thickness capabilities. Designed for use in the laboratory these gauges are the tool you need for all your flaw detecting needs.
NDT Master Lecturer
In the program both university professors and practitioners will give lectures, which guarantees the
oretical depth and practical inside. Academic Director: Prof. Dr. Christian Boller
The following lecturers are not complete: Prof. Tadeusz Stepinski, Prof. Wieslaw Staszewski, Prof. Frank Walther, Prof. Giovanni Bruno, Prof. Gerd Dobmann, Prof. Philippe Guy
GEKKO - Portable Phased Array Testing with TFM in Real-Time
The portable phased array testing system GEKKO provides 64 parallel test channels. On creating testi
ng parameters the operator is assisted by the CIVA software. Due to its modular set-up the GEKKO instrument is suitable for operators of all skill levels.
In high volume industries like automotive the requirement for a hundred percent X-ray inspection c
reates a bottleneck in the production. The XRHRobotStar is a fully Automated Defect Recognition (ADR) capable robot-system that allows an ultra-fast in-line inspection.