where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -

341 views
Technical Discussions
Rolf Diederichs
Director, Editor
NDT.net, Germany, Joined Nov 1998, 602

Rolf Diederichs

Director, Editor
NDT.net,
Germany,
Joined Nov 1998
602
00:36 Jan-08-2001
NDT.net January Issue released

I wish you a happy and prosperous New Year!
This month's issue features a review of the MTQ 2000 exhibition as
well as late incoming papers from the WCNDT 2000 and the EPRI conference.

NDT.net will continue to offer the best service for the NDT community.
One of our most important content elements are professional articles,
therefore we invite you to submit your papers on all NDT topics for future issues.
NDT conference hosts are welcome to publish their proceedings on CD-ROM and
add them to the NDT.net Database as we recently did with the WCNDT 2000.
For further information please contact me at rd@ndt.net.



    
 
 

Product Spotlight

Research and Applications Development For NDT

The Research and Applications Development (RAD) group is a newly formed team within Acuren dedicat
...
ed to tackling challenging inspection problems. Our focus is the development of novel, field deployable, advanced inspection techniques for use in cases where standard NDT methods are ineffective. We don't wait for new innovations, we engineer them. From concept to commissioning.
>

FMC/TFM

Next generation for Phased Array UT is here now with FMC/TFM! Have higher resolution imaging, impr
...
oved signal to noise ratio, characterize, size and analyze defects better with access to several wave mode views and save raw FMC data for higher quality analysis.  Some of the benefits are:
  • Beautiful Image! Easier to understand what you're looking at
  • Completely focused in entire image or volume
  • Much easier to define setups before inspection
  • Easier to decipher geometry echoes from real defects
  • Oriented defects (e.g. cracks) are imaged better
  • See image from different wave modes from one FMC inspection
  • FMC data can be reprocessed/analyzed without going back to the field
>

NEW! The PragmaPro Instrument Platform

The PragmaPro is based on a modular cartridge technology and supports various NDT instrument modal
...
ities such as UT, PAUT, ECT and many more. This new platform is based on a machined, powder-coated aluminum frame for shock-proofness, best sealing qualities and maximum heat dissipation. This is practical to extend the outdoor temperature range and/or to extend the power injected in the transducers. The PragmaPro is aiming at a very wide range of applications, such as weld scanning, corrosion mapping and composite testing.
>

GEKKO, Standard and Advanced phased-array for Easier inspection

With a 64-channel parallel architecture, GEKKO is a flaw detector offering at the same time conven
...
tional UT, standard PAUT, TOFD and real-time Total Focusing Method (TFM). GEKKO improves the detection, with better defects characterization and sizing as well as for misoriented defects. Some procedures require standard UT, others TOFD or PA. GEKKO includes all these techniques to offer a versatile and field-ready equipment. - 64:64 parallel channels - + 4 additional TOFD - Conventional UT channels - International code compliance: ASME, AWS, API, ASTM, ISO-EN Watch the video: https://youtu.be/kuEY_RwWS3Q
>

Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window
s