- since 1996 -
NEW - TD Focus-ScanRX
The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
Research and Applications Development For NDT
The Research and Applications Development (RAD) group is a newly formed team within Acuren dedicat
ed to tackling challenging inspection problems. Our focus is the development of novel, field deployable, advanced inspection techniques for use in cases where standard NDT methods are ineffective. We don't wait for new innovations, we engineer them. From concept to commissioning.
FAAST-PA! OEM Patented phased Array for high speed UT inspection
Multiangle, Multifocus, Multifrequency, Multibeam. Instead of stacking UT electronics and having m
any PA probes, FAAST-PA is able to transmit all delay laws within ONE single shot in Real time.
Teledyne ICM’s CPSERIES has been designed with a view to revolutionizing the handling and perfor
mances of portable X-Ray sets. Despite having managed to halve the weight of similar portable X-Ray generators available on the market (while continuing to provide the same power output), the SITEX CPSERIES generators feature a shutter, a laser pointer, a beryllium window, an aluminum filter and two integrated diaphragms (customized sizes are available upon request). Without compromising the robustness and reliability for which ICM products are renowned, the small size and light weight of the SITEX CPSERIES will radically change the way that you perform your RT inspections. And you will see a positive impact in terms of both quality and return on investment (ROI).