where expertise comes together
- since 1996 -
- since 1996 -
MUSE Mobile Ultrasonic Equipment
The MUSE, a portable ultrasonic imaging system, was developed for in-field inspections of light-weig
ht structures. The MUSE consists of a motor-driven manipulator, a water circulation system for the acoustic coupling and a portable ultrasonic flaw detector (USPC 3010). The MUSE provides images of internal defects (A-, B-,C- and D-scan).
NOVO Armor 15 & NOVO Armor 22
The Armor Kit Contains the NOVO Armor, which provides additional mechanical protection to the NOVO 1
5WN & NOVO 22WN Detectors, the Armor Stand and a traveling soft cover. - Newest shock absorbent technology case - Water resistant design - Supports wired & wireless communication - Multiple positioning options - Tripod connection using the Built-in 1/4” threads - Simple Detector battery replacement
IntraPhase Athena Phased Array System
The Athena Phased Array system, manufactured by WesDyne NDE Products & Technology, consists of a pha
sed array acquisition system and PC running IntraSpect software. A PC is used to perform acquisition, analysis and storage of the data. System hardware is capable of operating up to four data sets with any combination of phased array or conventional UT probes. NOW AVAILABLE IN 64-64 CONFIGURATION.
Research and Application Development For NDT
Acuren’s Research and Application Development specializes in the development of advanced ultraso
nic inspection techniques and systems for challenging inspection applications, with an emphasis on practical solutions which are field deployable. Services include manual and automated ultrasonic inspection system development, inspection technique optimization using laboratory scale studies and ultrasonic modeling (CIVA, BeamTool), preparing technical justification for technique evaluation and qualification (Probability of Detection and sizing accuracy studies), inspection/calibration/analysis procedure preparation to support field deployment of custom techniques, and development of custom imaging algorithms to support challenging inspection applications.