where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -
213 views
Technical Discussions
Rajesh Bose
Rajesh Bose
06:49 Feb-26-2001
Radiography

Dear NDT Friends,

I would like to know that in which code is it mentioned that how much film overlap one must give between successive films while carrying out radiography by Ir-192 source of pipes. Is it mentioned in ASME Sec-V?

Thanks,

Rajesh Bose




 
 Reply 
 

Product Spotlight

Combination of Digital Image Correlation and Thermographic Measurements

The combination of measuring results from the digital image correlation (ARAMIS, DIC) and temperat
...
ure measuring data from infrared cameras permits the simultaneous analysis of the thermal and mechanical behavior of test specimens in the materials and components testing field.
>

MIZ®-21C: Truly Affordable Eddy Current Handheld with Surface Array Capability

Introducing MIZ-21C, the first truly affordable handheld eddy current instrument with surface array
...
capabilities. MIZ-21C can deliver fast, accurate inspections in demanding NDT applications including aerospace, oil and gas, manufacturing, and power generation. The surface array solution can reduce inspection time by up to 95% compared to traditional handheld pencil probes. The ergonomic design, long battery life, and intuitive touchscreen mean you can inspect more areas faster than ever without fatigue.
>

Teletest Focus+

Teletest Focus+ electronics have superior capabilities than rivals on the market. Beyond the usual
...
test features, Focus+ has 24 transmit channels and 24 receive channels, with an additional on-board switching capabilities. The instrument's frequency range is 10–300 kHz.
>

NEOS III

NEOS III is Logos Imagings lightest DR system. With a built-in battery and internal wireless commu
...
nication, the NEOS III is perfect for users that want to quickly assess an item.
>

Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window