where expertise comes together
- since 1996 -
- since 1996 -
ScanMaster ultrasonic immersion systems are designed for high throughput, multi shift operation in a
n industrial or lab environment. These fully integrated systems provide various scanning configurations and incorporate conventional and phased arrays technologies to support diverse applications, such as inspection of disks, bars, shafts, billets and plates. All of ScanMaster immersion systems are built from high accuracy scanning frames allowing for scanning of complex parts and include a multi-channel ultrasonic instrument with exceptional performance. The systems are approved by all major manufacturers for C-scan inspection of jet engine forged discs. Together with a comprehensive set of software modules these flexible series of systems provide the customer with the best price performance solutions.
NDTkit RT, TESTIA's Digital Radiography software The NDTkit product line software for X-ray analysi
s. NDTkit RT is a software benefiting from the Ultis kernel which is dedicated to radiographic image analysis. It offers a set of tools and filtering processes to assist RT operators in finding relevant flaws.
HARDNESS TESTER TKM-459CE combi
TKM-459CE combi applies 2 methods of hardness control: UCI and Leeb. It provides high-accuracy tes
ting of metals and alloys as well as items of different sizes and configurations, their hardened layers and galvanic coatings. Device represents results in HB, HRC, HV and others. Shock-, dust- and water-proof housing with intuitive software make this gauge easy to use in all working conditions.
IntraPhase Athena Phased Array System
The Athena Phased Array system, manufactured by WesDyne NDE Products & Technology, consists of a pha
sed array acquisition system and PC running IntraSpect software. A PC is used to perform acquisition, analysis and storage of the data. System hardware is capable of operating up to four data sets with any combination of phased array or conventional UT probes. NOW AVAILABLE IN 64-64 CONFIGURATION.