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where expertise comes together
- since 1996 -

ACS-Solutions GmbH
develop and manufacture hi-tech devices for Ultrasonic Testing

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christopher o'brien
NDT Inspector, -
pcn, United Kingdom, Joined Jan 2009, 4

christopher o'brien

NDT Inspector, -
pcn,
United Kingdom,
Joined Jan 2009
4
00:58 Jan-07-2009
ndt tech

Job Location: uk/anywhere

pcn level 2 mpi, pcn level 2 ut 3.1 3.2, pcn level 2 tofd available for any projects email me for any info i.e cv certs etc regards C O'BRIEN.


    
 
 

Product Spotlight

Research and Applications Development For NDT

The Research and Applications Development (RAD) group is a newly formed team within Acuren dedicat
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ed to tackling challenging inspection problems. Our focus is the development of novel, field deployable, advanced inspection techniques for use in cases where standard NDT methods are ineffective. We don't wait for new innovations, we engineer them. From concept to commissioning.
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SONOAIR - air-coupled Phased Array Ultrasonic Inspection System

For highly attenuating materials, the performance of the system is critical. The ultrasonic sensors,
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the scanning area and the system settings should be flexibly adapted to the test task and the material. These high expectations are met with the new and modular testing system SONOAIR. With the world’s first air-coupled phased-array UT inspection system SONOAIR we developed a technology that works with up to 4 transmitter and receiver channels with freely configurable square wave burst transmitters as wells as low noise receiving amplifiers.
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NovaScope 6000

The all-digital Novascope 6000 is a portable, ultra-high precision thickness gauge for high-speed
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thickness measurement. Novascope 6000 has unmatched capabilities and unique features including: •Superior Resolution with high contrast, high-speed color RF display •High pulser voltage •Real-time video output •Increased internal/external data storage •Programmable SetUp features •Battery & AC Powered
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X-ray CT aids research into defect formation in AM parts

X-ray CT is used to research how additive manufacturing process parameters influence defect format
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ion in AM parts.
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