where expertise comes together - since 1996 -

The Largest Open Access Portal of Nondestructive Testing (NDT)

Conference Proceedings, Articles, News, Exhibition, Forum, Network and more

where expertise comes together
- since 1996 -
472 views
Technical Discussions
Mohd Zaki Nuawi
Consultant
National University of Malaysia, Malaysia, Joined Oct 1999, 5

Mohd Zaki Nuawi

Consultant
National University of Malaysia,
Malaysia,
Joined Oct 1999
5
09:49 Mar-08-2001
information on Barkhausen noise

Dear experts,
Does anyone have any information or journal on the Barkhausen Noise?


 
 Reply 
 
Oscar Rivera
Oscar Rivera
03:16 Mar-09-2001
Re: information on Barkhausen noise
: Dear experts,
: Does anyone have any information or journal on the Barkhausen Noise?
.If you have access to the search engine Google, enter Barkhausen noise. It will come up with many technical articles and applications pertaining to this topic



 
 Reply 
 

Product Spotlight

Lyft™: Pulsed Eddy Current Reinvented

PEC Reinvented—CUI Programs Redefined Corrosion under insulation (CUI) is possibly the greatest u
...
nresolved asset integrity problem in the industry. Current methods for measuring wall thickness with liftoff, without removing insulation, all have severe limitations. Eddyfi introduces Lyft — a reinvented, high-performance pulsed eddy current (PEC) solution. The patent- pending system features a state-of-the-art portable instrument, real- time C-scan imaging, fast data acquisition with grid-mapping and dynamic scanning modes, and flexibility with long cables. It can also scan through thick metal and insulation, as well as aluminum, stainless steel, and galvanized steel weather jackets. Who else but Eddyfi to reinvent an eddy current technique and redefine CUI programs. Got Lyft?
>

NEOS III

NEOS III is Logos Imagings lightest DR system. With a built-in battery and internal wireless commu
...
nication, the NEOS III is perfect for users that want to quickly assess an item.
>

Research and Applications Development For NDT

The Research and Applications Development (RAD) group is a newly formed team within Acuren dedicat
...
ed to tackling challenging inspection problems. Our focus is the development of novel, field deployable, advanced inspection techniques for use in cases where standard NDT methods are ineffective. We don't wait for new innovations, we engineer them. From concept to commissioning.
>

NEW - TD Focus-ScanRX

The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
...
ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
>

Share...
We use technical and analytics cookies to ensure that we will give you the best experience of our website - More Info
Accept
top
this is debug window