where expertise comes together
- since 1996 -
- since 1996 -
Research and Application Development For NDT
Acuren’s Research and Application Development specializes in the development of advanced ultraso
nic inspection techniques and systems for challenging inspection applications, with an emphasis on practical solutions which are field deployable. Services include manual and automated ultrasonic inspection system development, inspection technique optimization using laboratory scale studies and ultrasonic modeling (CIVA, BeamTool), preparing technical justification for technique evaluation and qualification (Probability of Detection and sizing accuracy studies), inspection/calibration/analysis procedure preparation to support field deployment of custom techniques, and development of custom imaging algorithms to support challenging inspection applications.
IRIS 9000Plus - Introducing the next generation of heat exchanger inspection.
Representing the seventh generation of the IRIS system, the IRIS 9000 Plus has nearly 200 years of c
ombined field inspection experience incorporated in its design. This experience combined with a strong commitment to quality and a history of innovation has made Iris Inspection Services® the undisputed leader in IRIS technology.
iProbe - USB Phased Array Probe
Turn your PC, Laptop or Tablet into a powerful 32:64 Phased Array system with our USB powered Phas
ed Array iProbe and inspection software package. Perform affordable weld inspection and corrosion mapping inspections with this powerful but small system. The probe has a 100V pulser, 8K PRF, dual axis encoder input and achieves outstanding signal quality.
CIVA 2020 UT Module
CIVA NDE Simulation Software is the world leader of NDT Simulation. The UT simulation Module incl
udes: - "Beam computation": Beam propagation simulation - "Inspection Simulation": Beam interaction with flaws or specimens The user can simulate a whole inspection process (pulse echo, tandem or TOFD) with a wide range of probes (conventional, Phased- arrays or EMAT), components, and flaws.