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- since 1996 -

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steven
Sales, Products Market Development Manager
NDTec SUPPLIES PTE LTD, Singapore, Joined Dec 2006, 2

steven

Sales, Products Market Development Manager
NDTec SUPPLIES PTE LTD,
Singapore,
Joined Dec 2006
2
07:47 Feb-08-2006
NukeAlert Miniature Detector 4sale

we have 3 brand new Miniature NukeAlert detector (retailed USD145) to be offloaded..asking USD100/ea + USD15 for
shipping worldwide.payment via PayPal or Neteller or T/T
are all acceptable.


    
 
 

Product Spotlight

NEW - TD Focus-ScanRX

The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
...
ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
>

FMC/TFM

Next generation for Phased Array UT is here now with FMC/TFM! Have higher resolution imaging, impr
...
oved signal to noise ratio, characterize, size and analyze defects better with access to several wave mode views and save raw FMC data for higher quality analysis.  Some of the benefits are:
  • Beautiful Image! Easier to understand what you're looking at
  • Completely focused in entire image or volume
  • Much easier to define setups before inspection
  • Easier to decipher geometry echoes from real defects
  • Oriented defects (e.g. cracks) are imaged better
  • See image from different wave modes from one FMC inspection
  • FMC data can be reprocessed/analyzed without going back to the field
>

NDT.net launches mobile-friendly design

NDT.net has revamped its website providing a mobile-friendly design.The front page received a comp
...
letely new design and all other sections are now reacting responsively on mobile devices. This has been a major step to make our website more user- friendly.
>

X-ray CT aids research into defect formation in AM parts

X-ray CT is used to research how additive manufacturing process parameters influence defect format
...
ion in AM parts.
>

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