where expertise comes together
- since 1996 -
- since 1996 -
Teledyne ICM’s CPSERIES has been designed with a view to revolutionizing the handling and perfor
mances of portable X-Ray sets. Despite having managed to halve the weight of similar portable X-Ray generators available on the market (while continuing to provide the same power output), the SITEX CPSERIES generators feature a shutter, a laser pointer, a beryllium window, an aluminum filter and two integrated diaphragms (customized sizes are available upon request). Without compromising the robustness and reliability for which ICM products are renowned, the small size and light weight of the SITEX CPSERIES will radically change the way that you perform your RT inspections. And you will see a positive impact in terms of both quality and return on investment (ROI).
OmniScan™ X3 flaw detector
The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, like total focus
ing method (TFM) images and advanced visualization capabilities, enable you to complete your inspection with greater confidence.
NEW - TD Focus-ScanRX
The NEW Next Generation Advanced UT platform, TD Focus ScanRX - Also available as a card stack solut
ion. Key Improvements 1. Data acquisition is significantly faster than current design 2. Better aesthetic – closely aligns with HandyScan RX 3. Improved IP rating (Target IP66) 4. Ruggedized housing 5. Connectors are protected from impact and ingress 6. Integrated stand and separate retractable handle easy to keep clean) 7. Touchscreen with ruggedized display glass 8. 3-Axis encoder input
Robotic laser shearography enables 100% inspection of complex, flight-critical composite structures
An article in “Composites World Magazine” showcases Non Destructive Testing of aero-structures
with Laser Shearography. Over the years Dantec Dynamics has supplied many solutions for the aerospace industry. Referring to specific customer projects several of these cases are examined to outline the advantages of using Laser Shearography for automated defect detection.