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where expertise comes together
- since 1996 -

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Jim Salton
Jim Salton
03:16 Aug-27-2007
Omni 100

WANTED: Omni 100 Tester


    
 
 

Product Spotlight

NDT Master Lecturer

In the program both university professors and practitioners will give lectures, which guarantees the
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oretical depth and practical inside. Academic Director: Prof. Dr. Christian Boller
The following lecturers are not complete: Prof. Tadeusz Stepinski, Prof. Wieslaw Staszewski, Prof. Frank Walther, Prof. Giovanni Bruno, Prof. Gerd Dobmann, Prof. Philippe Guy
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FMC/TFM

Next generation for Phased Array UT is here now with FMC/TFM! Have higher resolution imaging, impr
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oved signal to noise ratio, characterize, size and analyze defects better with access to several wave mode views and save raw FMC data for higher quality analysis.  Some of the benefits are:
  • Beautiful Image! Easier to understand what you're looking at
  • Completely focused in entire image or volume
  • Much easier to define setups before inspection
  • Easier to decipher geometry echoes from real defects
  • Oriented defects (e.g. cracks) are imaged better
  • See image from different wave modes from one FMC inspection
  • FMC data can be reprocessed/analyzed without going back to the field
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Immersion systems

ScanMaster ultrasonic immersion systems are designed for high throughput, multi shift operation in a
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n industrial or lab environment. These fully integrated systems provide various scanning configurations and incorporate conventional and phased arrays technologies to support diverse applications, such as inspection of disks, bars, shafts, billets and plates. All of ScanMaster immersion systems are built from high accuracy scanning frames allowing for scanning of complex parts and include a multi-channel ultrasonic instrument with exceptional performance. The systems are approved by all major manufacturers for C-scan inspection of jet engine forged discs. Together with a comprehensive set of software modules these flexible series of systems provide the customer with the best price performance solutions.
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X-ray CT aids research into defect formation in AM parts

X-ray CT is used to research how additive manufacturing process parameters influence defect format
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ion in AM parts.
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